Veeco Nanoscope II AFM | Scanning Probe Microscopy Facility

Veeco Nanoscope II AFM

Overview

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in both gas and liquid environments.

Capabilities

SOP

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.

General purpose tapping mode cantilevers are available for $21 each. Users will be charged for a new training cantilever. Afterwards, users can purchase any other type of cantilever themselves. Contact staff for a vendor list.

Training

Courses

BL 4035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with emphasis on sample preparation. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: Must be enrolled in one of the following Class(es): Junior, Senior

BL 5035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with an emphasis on sample preparation. Emphasis will be placed on application of advanced techniques. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore, Junior

Location

M&M 616

Calendar Name

ACMAL-Veeco AFM

Access Type

Logbook