Asylum Research MFP-3D Origin+ AFM | Scanning Probe Microscopy Facility

Overview

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories.

Capabilities

The Asylum Research MFP-3D Origin+ AFM features the same core performance as the MFP-3D Origin but includes support for the complete range of innovative MFP-3D accessories.
High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
Modern flexured and sensored scanner design
Large sample stage
Numerous environmental accessories for temperature control
Controlled gas or liquid environment options that are simple, safe, and effective
Unique accessories for applying external forces to a wide range of samples

SOP

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.

General purpose tapping mode cantilevers are available for $21 each. Users will be charged for a new training cantilever. Afterwards, users can purchase any other type of cantilever themselves. Contact staff for a vendor list.

Vendor

Oxford Instruments Asylum Research offers brochures and webinars related to the Origin AFM.

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Asylum Research MFP-3D Origin+ AFM Training Index

AC Air Operation

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

Some of these courses offer advanced study of surfaces.

MSE 5665 - Surface and Interface Science for Chemical and Materials Analysis

Coursework and hands-on laboratory experiences explore physical and chemical properties governing surface processes and the appropriate analysis techniques used to study interfaces and surface chemical reactions. Topics include principles of physical chemistry and materials science for understanding and applying modern surface analysis.

Credits: 3.0
Lec-Rec-Lab: (2-0-2)
Semesters Offered: On Demand
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore

BL 4035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with emphasis on sample preparation. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: Must be enrolled in one of the following Class(es): Junior, Senior

BL 5035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with an emphasis on sample preparation. Emphasis will be placed on application of advanced techniques. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore, Junior