Hitachi S-4700 FE-SEM

Close up the primary instrumentation for the FE-SEM.

Location

Minerals and Materials Engineering Building 636

Contact

Erico Freitas

Access Type

FOM

Instrument Details

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software.

Capabilities

  • Accelerating Voltages from 1–30 kV
  • Everhar-Thornley secondary electron detector
  • Retractable Robinson backscattered electron detector
  • Through-the-lens secondary electron detector

Vendor

Hitachi

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Courses