| Allied High Tech Products MultiPrep Polishing System |
Electron Optics |
M&M 637 |
|
| Anatech Hummer 6 for Etching |
Electron Optics |
M&M 637 |
|
| Asylum Research MFP-3D Origin+ AFM |
Electron Optics |
M&M 632 |
|
| Attune NxT Acoustic Focusing Cytometer |
Confocal Imaging |
Chem Sci S012 |
|
| Cantilever Tips |
Scanning Probe Microscopy |
|
|
| Cell Culture Laboratory |
Confocal Imaging |
Chem Sci S012 |
|
| Cressington 208HR Sputter Coater |
Electron Optics |
M&M 637 |
|
| Denton DV-502A Carbon Evaporator |
Electron Optics |
M&M 637 |
|
| FEI 200kV Titan Themis STEM |
Electron Optics |
ATDC Building, West End |
Yes |
| Hitachi FB-2000A FIB |
Electron Optics |
M&M 632 |
|
| Hitachi S-4700 FE-SEM |
Electron Optics |
M&M 636 |
|
| Image Analysis Laboratory |
|
M&M 631 |
|
| JEOL IB-19500CP Ion Mill |
Electron Optics |
M&M 637 |
|
| Leica CPD 030 Critical Point Dryer |
Electron Optics |
M&M 637 |
|
| Leica FCS UCT Cryo Ultramicrotome Attachment |
Electron Optics |
|
|
| Leica Ultracut UCT Ultramicrotome |
Electron Optics |
M&M 637 |
|
| Liquid Nitrogen |
Electron Optics |
|
|
| Nanomechanics iNano Nanoindentor System |
|
|
|
| Olympus FluoView FV1000 Confocal Microscope |
Confocal Imaging |
Chem Sci S012 |
|
| PELCO easiGlow Glow Discharge Cleaning System |
|
|
|
| Perkin Elmer PHI-660 Scanning Auger Microscope |
Surface Analysis |
M&M 615 |
|
| PHI 5800 X-ray Photoelectron Spectrometer |
Surface Analysis |
M&M 633 |
|
| Philips Electronic Instruments X-ray Generator |
X-Ray |
M&M U105 |
|
| Philips XL 40 ESEM |
Electron Optics |
M&M 717 |
Yes |
| Scintag X2 Powder Diffractometer (coming soon) |
X-Ray |
|
|
| Scintag XDS2000 Powder Diffractometer |
X-Ray |
M&M 629 |
Yes |
| Scintag XDS-2000 PTS |
X-Ray |
M&M 629 |
Yes |
| Siemens D500 Powder Diffractometer |
X-Ray |
M&M U104 |
|
| SouthBay Technology Model 650 Low Speed Saw |
Electron Optics |
M&M 637 |
|
| SouthBay Technology Model 850 Abrasive Slurry Saw |
Electron Optics |
M&M 637 |
|
| SouthBay Technology MS501B Twinl Jet Electropolisher |
Electron Optics |
M&M 637 |
|
| Specimen Preparation |
Electron Optics |
M&M 637 |
|
| Supplies |
Electron Optics |
|
|
| Thermo Fisher Apreo 2 FE-SEM |
Electron Optics |
M&M 630 |
|
| Veeco Dimension 3000 AFM |
Scanning Probe Microscopy |
M&M 616 |
|
| Veeco Nanoscope II AFM |
Scanning Probe Microscopy |
M&M 616 |
|
| Xenemetrix EX-6600 EDS |
X-Ray |
M&M 612D |
|
